Inverted metallurgical microscope for the inspection of bulky samples. Too massive for an upright microscope, the AE2000MET Series allows material research with Incident Brightfield or Darkfield objectives.
AE2000MET Series features CCIS© LM Plan Achromatic objectives in Brightfield and Darkfield version for diverse reflective samples. The N-WF10X/20 eyepieces provide a fast sample overview, while the diopter adjustment on both eyepieces allows an individual adaption to the user's visibility.
The AE2000MET microscopes feature a powerful 100W Halogen illumination system with Field- and Aperture diaphragm, with an Auto ON/OFF function implemented for lab safety.
The hard-coated 3-plate stage carries heavy samples, as focusing is done through the substage nosepiece. The left-sided 5-fold nosepiece with a z-movement of 2 µm minimum increment is prepared for a precise focusing.
For the detection of grain boundaries in steel, a Darkfield outfit must be chosen. Polarization contrast in Brightfield is done by the common combination of Polarizer & Analyzer, but also to avoid undesirable reflections in lower magnifications.
The AE2000 MET inverted microscope features a powerful Halogen 100W illumination.
The Auto ON/OFF mode assures lab safety and an energy-saving usage.
Scratch-resistant 3-plate mechanical stage has an extended surface area and a travel range of 50x50mm for safe and fast inspections.
